IC Qualification Testing

HiRel Testing Services began in 2008 to test ASIC oscillator as semiconductor IC, to all parameters of the IC datasheet, both DC and AC, and per requirements of MIL-PRF-3853, MIL-PRF-38534, and portions of MIL-QPL-55310.

VC America provides testing, characterization, and qualification services for all oscillator clock IC (to 1GHz) and RTC IC plus clock oscillator from CMOS clocks to OXCO.

Characterization of oscillator IC and components over temperature range of -70°C to 150°C.

Testing 100% of datasheet DC and AC (to 600MHz) parameters at all testing temperatures.

Products include: Oscillator Integrated circuits of output type CMOS, LVDS, LVPECL, HCSL, CML

Element Evaluation and qualification of oscillator IC's to the requirements of Mil-PRF-38534 and Mil-PRF-55310 and enhanced per program requirements.

• SEM (Scanning Electron Microscope)
• Applicable to NPC BiCMOS process
• Planar and cross-sectional for step coverage
• Current Density analysis
• No SEM required for current processes using CMP ([self-aligned silicide processes]
• QCI sample evaluation build
• Sample size 10, 22, 45, 72 or as required.
• 240 - hour Dynamic burn-in
• 1000 - hour 125°C burn-in Life testing [static or dynamic]
• Electrical evaluation testing at -55°C, 25°C, 125°C
• Data reporting
• Datasheet test parameters DC and AC at tested temperatures
• Deltas and variables reporting available